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Home ›  CC14 > CD74ACT74E-CD74ACT74M-CD74ACT74M96-CD74ACT74M96G4,Dual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset
CD74ACT74E-CD74ACT74M-CD74ACT74M96-CD74ACT74M96G4 Fast Delivery,Good Price
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Partno Mfg Dc Qty AvailableDescript
CD74ACT74EHARRISN/a503avaiDual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset
CD74ACT74MTIN/a409avaiDual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset
CD74ACT74MHARN/a2198avaiDual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset
CD74ACT74M96TIN/a7300avaiDual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset
CD74ACT74M96G4TI/BBN/a1163avaiDual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset 14-SOIC -55 to 125


CD74ACT74M96 ,Dual Positive-Edge-Triggered D-Type Flip-Flops with Set and Resetmaximum ratings over operating free-air temperature range (unless otherwise noted)Supply voltage ra ..
CD74ACT74M96G4 ,Dual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset 14-SOIC -55 to 125/sc/package.FUNCTION TABLE(each flip-flop)INPUTS OUTPUTSPRE CLR CLK D Q QL H X X H LH LX XL H† †L L ..
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CD74ACT86E ,Quad 2-Input Exclusive-OR GatesCD54ACT86, CD74ACT86 QUADRUPLE 2-INPUT EXCLUSIVE-OR GATES SCHS322 – JANUARY 2003CD54ACT86 ...F PAC ..
CD74ACT86E ,Quad 2-Input Exclusive-OR Gatesmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
CD74ACT86E ,Quad 2-Input Exclusive-OR Gatesmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
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CD74ACT74E-CD74ACT74M-CD74ACT74M96-CD74ACT74M96G4
Dual Positive-Edge-Triggered D-Type Flip-Flops with Set and Reset
±24-mA Output Drive Current– Fanout to 15 F Devices SCR-Latchup-Resistant CMOS Process and
Circuit Design
Exceeds 2-kV ESD Protection Per
MIL-STD-883, Method 3015
description/ordering information

The ’ACT74 dual positive-edge-triggered devices are D-type flip-flops.
A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the
other inputs. When PRE and CLR are inactive (high), data at the data (D) input meeting the setup time
requirements is transferred to the outputs on the positive-going edge of the clock pulse. Clock triggering occurs
at a voltage level and is not related directly to the rise time of the clock pulse. Following the hold-time interval,
data at the D input can be changed without affecting the levels at the outputs.
ORDERING INFORMATION
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
FUNCTION TABLE
(each flip-flop)
This configuration is nonstable; that is, it does not
persist when PRE or CLR returns to its inactive
(high) level.
1CLK
1PRE
GND
2CLK
2PRE
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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