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Partno Mfg Dc Qty AvailableDescript
54F74DMQBN/a10avaiDual D-Type Positive Edge-Triggered Flip-Flop
JM38510/34101BCA |JM3851034101BCANSN/a9avaiDual D-Type Positive Edge-Triggered Flip-Flop
JM38510/34101BDA |JM3851034101BDANSN/a29avaiDual D-Type Positive Edge-Triggered Flip-Flop


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54F74DMQB-JM38510/34101BCA-JM38510/34101BDA
Dual D-Type Positive Edge-Triggered Flip-Flop
Original Creation Date: 03/13/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/13/96MN54F74-X REV 1A0
MILITARY DATA SHEET
DUAL D-TYPE POSITIVE EDGE-TRIGGERED FLIP-FLOP
General Description

The F74 is a dual D-type flip-flop with Direct Clear and Set inputs and complementary
(Q/Q) outputs. Information at the input is transferred to the outputs on the positive
edge of the clock pulse. Clock triggering occurs at a voltage level of the clock pulse
and is not directly related to the transition time of the positive-going pulse. After the
Clock Pulse Input threshold voltage has been passed, the Data inputs is locked out and
information present will not be transferred to the outputs until the next rising edge of
the Clock Pulse input.
Asynchronous Inputs:
LOW Input to Sd sets Q to HIGH level
LOW Input to Cd sets Q to LOW level
Clear and Set are Independent of clock
Simultaneous LOW on Cd and Sd makes both Q and Q HIGH
NS Part Numbers

54F74DMQB
54F74FMQB
54F74LMQB
Industry Part Number

54F74
Prime Die

M074
Processing

MIL-STD-883, Method 5004
Quality Conformance Inspection

MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
o Static tests at +25 Static tests at +125 Static tests at -55 Dynamic tests at +25 Dynamic tests at +125 Dynamic tests at -55 Functional tests at +25 Functional tests at +125 Functional tests at -55 Switching tests at +25 Switching tests at +125 Switching tests at -55
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