EMF5XV6T5 ,Power Management Dual TransistorsELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted, common for Q and Q )A 1 2Characteristi ..
EMH2412 ,N-Channel Power MOSFET, 24V, 6A, 27mOhm, Dual EMH8Maximum RatingsParameter Symbol Conditions Ratings UnitDrain-to-Source Voltage V 24 VDSSGate-to-Sou ..
EMI4182 ,Common Mode Filter with ESD ProtectionFeatures42M Highly Integrated Common Mode Filter (CMF) with ESD ProtectionWDFN10provides protect ..
EMI4183 ,Common Mode Filter with ESD ProtectionFeatures Highly Integrated Common Mode Filter (CMF) with ESD ProtectionWDFN16provides protection ..
EMIF01-10005W5 ,EMI FILTER, INCLUDING ESD PROTECTIONAPPLICATIONSWhere EMI filtering in ESD sensitive equipment is required :Computers and printers ..
EMIF01-10018W5 ,EMI FILTER INCLUDING ESD PROTECTIONAPPLICATIONSWhere EMI filtering in ESD sensitive equipment is required :Computers and printers ..
ES1F ,1.0A Ultra Fast Recovery Rectifierapplications. • Glass passivated junction. • Low profile package.• Easy pick and place.• Built-in s ..
ES1H ,1.0A Ultra Fast Recovery Rectifierapplications. • Glass passivated junction. • Low profile package.• Easy pick and place.• Built-in s ..
ES1J ,1.0A Ultra Fast Recovery RectifierFeatures• For surface mount
ES3J ,3.0 UltraFast Recovery RectifierES3A - ES3J — Fast RectifiersApril 2012ES3A - ES3JFast Rectifiers
EMF5XV6T5
Power Management Dual Transistors
EMF5XV6T5
Power Management,
Dual Transistors
NPN Silicon Surface Mount Transistors
with Monolithic Bias Resistor Network
Features Simplifies Circuit Design Reduces Board Space Reduces Component Count These are Pb−Free Devices
MAXIMUM RATINGS
Q1 (TA = 25°C unless otherwise noted, common for Q1 and Q2)
Q2 (TA = 25°C)
THERMAL CHARACTERISTICSMaximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
