SN54LS47J ,BCD TO 7-SEGMENT DECODER/DRIVER
SN54LS47J ,BCD TO 7-SEGMENT DECODER/DRIVER
SN54LS47J ,BCD TO 7-SEGMENT DECODER/DRIVER
SN54LS48J ,BCD TO 7-SEGMENT DECODER
SN54LS490J ,DUAL DECADE COUNTER
SN54LS490J ,DUAL DECADE COUNTER
SN74HC126N ,Quadruple Bus Buffer Gates With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74HC126NSR ,Quadruple Bus Buffer Gates With 3-State Outputslogic diagram (positive logic)1 101OE 3OE2 3 9 81A 1Y 3A 3Y4 132OE 4OE5 6 12 112A 2Y 4A 4YPin numbe ..
SN74HC126PW ,Quadruple Bus Buffer Gates With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74HC126PWR ,Quadruple Bus Buffer Gates With 3-State Outputs SCLS103E − MARCH 1984 − REVISED JULY 200 ..
SN74HC126PWT ,Quadruple Bus Buffer Gates With 3-State Outputslogic diagram (positive logic)1 101OE 3OE2 3 9 81A 1Y 3A 3Y4 132OE 4OE5 6 12 112A 2Y 4A 4YPin numbe ..
SN74HC132 ,Quadruple Positive-NAND Gates With Schmitt-Trigger InputsFeatures... 18.4 Device Functional Modes...... 82 Applications..... 19 Application and Implementati ..
SN54LS47J
BCD TO 7-SEGMENT DECODER/DRIVER
BCD TO 7-SEGMENT
DECODER/DRIVERThe SN54/74LS47 are Low Power Schottky BCD to 7-Segment Decod-
er/Drivers consisting of NAND gates, input buffers and seven AND-OR-IN-
VERT gates. They offer active LOW, high sink current outputs for driving
indicators directly. Seven NAND gates and one driver are connected in pairs
to make BCD data and its complement available to the seven decoding
AND-OR-INVERT gates. The remaining NAND gate and three input buffers
provide lamp test, blanking input/ripple-blanking output and ripple-blanking
input.
The circuits accept 4-bit binary-coded-decimal (BCD) and, depending on
the state of the auxiliary inputs, decodes this data to drive a 7-segment display
indicator. The relative positive-logic output levels, as well as conditions
required at the auxiliary inputs, are shown in the truth tables. Output
configurations of the SN54/74LS47 are designed to withstand the relatively
high voltages required for 7-segment indicators.
These outputs will withstand 15 V with a maximum reverse current of
250 μA. Indicator segments requiring up to 24 mA of current may be driven
directly from the SN74LS47 high performance output transistors. Display
patterns for BCD input counts above nine are unique symbols to authenticate
input conditions.
The SN54/74LS47 incorporates automatic leading and/or trailing-edge
zero-blanking control (RBI and RBO). Lamp test (LT) may be performed at any
time which the BI/RBO node is a HIGH level. This device also contains an
overriding blanking input (BI) which can be used to control the lamp intensity
by varying the frequency and duty cycle of the BI input signal or to inhibit the
outputs. Lamp Intensity Modulation Capability (BI/RBO) Open Collector Outputs Lamp Test Provision Leading/Trailing Zero Suppression Input Clamp Diodes Limit High-Speed Termination Effects
VCC g a b c d e C LT BI/RBO RBI D A GND
CONNECTION DIAGRAM DIP (TOP VIEW)
PIN NAMES LOADING (Note a)A, B, C, D
RBI
BI/RBO
a, to g
BCD Inputs
Ripple-Blanking Input
Lamp-Test Input
Blanking Input or
Ripple-Blanking Output
Outputs
NOTES: 1 Unit Load (U.L.) = 40 μA HIGH, 1.6 mA LOW.
