SN74ABT8646DW ,Scan Test Devices With Octal Bus Transceivers And Registers SCBS123F − AUGUST 1992 − ..
SN74ABT8996 ,10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers SN54ABT8996, SN74ABT8996 10-BIT ADDRESSABLE SCAN PORTSMULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) ..
SN74ABT8996PW ,10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers SN54ABT8996, SN74ABT8996 10-BIT ADDRESSABLE SCAN PORTSMULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) ..
SN74ABT8996PWLE ,10-Bit Addressable Scan Ports Multidrop-Addressable IEEE STD 1194.1 (JTAG) TAP Transceivers SN54ABT8996, SN74ABT8996 10-BIT ADDRESSABLE SCAN PORTSMULTIDROP-ADDRESSABLE IEEE STD 1149.1 (JTAG) ..
SN74ABTE16245DGGR ,16-bit Incident-Wave Switching Bus Transceivers With 3-State Outputsmaximum ratings” may cause permanent damage to the device. These are stress ratings only, andfuncti ..
SN74ABTE16245DL ,16-bit Incident-Wave Switching Bus Transceivers With 3-State Outputs SN54ABTE16245, SN74ABTE16245 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERSWITH 3-STATE OUTPUTSSC ..
SN74LS161AML1 , BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AMR1 , BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AMR1 , BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AN ,BCD decade counter/4-bit binary counterSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161AN.. ,BCD decade counter/4-bit binary counterSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74LS161N ,BCD DECADE COUNTERS/ 4-BIT BINARY COUNTERSSN54/74LS160ASN54/74LS161ASN54/74LS162ABCD DECADE COUNTERS/SN54/74LS163A4-BIT BINARY COUNTERSThe LS ..
SN74ABT8646DW
Scan Test Devices With Octal Bus Transceivers And Registers
Functionally Equivalent to ’F646 and’ABT646 in the Normal-Function Mode SCOPE Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST , CLAMP,
and HIGHZ
− Parallel-Signature Analysis at Inputs
With Masking Option
− Pseudorandom Pattern Generation From
Outputs
− Sample Inputs/Toggle Outputs
− Binary Count From Outputs
− Even-Parity Opcodes Two Boundary-Scan Cells Per I/O for
Greater Flexibility State-of-the-Art EPIC-ΙΙB BiCMOS Design
Significantly Reduces Power Dissipation Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic DIPs
(JT)
descriptionThe ’ABT8646 and scan-test devices with octal
bus transceivers and registers are members of the
Texas Instruments SCOPE testability
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers
and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE octal bus transceivers and registers.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
